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透過電子顕微鏡基本用語集
  透過電子顕微鏡を用いた評価・分析に関する、理論や装置、試料結晶に関する基礎知識などについて解説しています。 提供 日本電子 URL http://www.jeol.co.jp/ |
透過電子顕微鏡基本用語集 のさくいん
「S」から始まる用語のさくいん
- SAD
- satellite reflection
- scanning coil
- scanning electron microscope
- scanning low energy electron microscope
- scanning transmission electron microscope image
- scattering angle
- scattering contrast
- scattering cross section
- Scherzer focus
- Schottky effect
- Schottky-type electron gun
- scintillator
- screw axis
- scroll pump
- SDD
- secondary electron
- secondary-electron detector
- sector analyzer
- segregation
- selected-area aperture
- selected-area diffraction
- selection rule
- SEM
- semiconductor detector
- serial detection
- sextupole
- short-range order parameter
- side-entry stage
- silicon drift detector
- silicon-intensifier-target tube
- single crystal
- single particle analysis
- single scattering
- sintering
- site occupancy
- site occupation
- SIT管
- SLEEM
- slow-scan CCD camera
- smoothing
- solid angle
- solid solution
- space lattice
- spatial frequency
- specimen cooling holder
- specimen cooling-tilting holder
- specimen drift
- specimen environment
- specimen heating holder
- specimen heating-tilting holder
- specimen preparation
- specimen rotating holder
- specimen support
- specimen tilting holder
- spectra
- spherical aberration
- spin orbit coupling
- spin polarized electron
- spiral distortion
- sputter ion pump
- SSD
- stacking fault
- standardless correction
- standardless quantification
- standing wave
- starting pressure
- STEM image
- stereo microscopy
- stigmatic focus
- stigmator
- Stobb's factor
- stopping power
- stray magnetic field
- sublimation pump
- substitution
- substitutional atom
- sum peak
- superlattice
- supporting film
- surface plasmon
- systematic reflection
- S字ひずみ
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