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走査電子顕微鏡基本用語集
  走査電子顕微鏡に関する、理論や装置、観察手法などについて解説しています。 提供 JEOL URL http://www.jeol.co.jp/ |
走査電子顕微鏡基本用語集 のさくいん
「S」から始まる用語のさくいん
- SAECP
- SAM
- sapphire knife
- scale marker
- scan rotation
- scanning
- scanning Auger microscope
- scanning coil
- scanning electron diffraction microscope
- scanning electron microscope
- scanning electron microscopy
- scanning ion microscope image
- scanning LEEM
- scanning line
- scanning low-energy electron microscope
- scanning reflection electron microscope
- scanning speed
- scanning transmission electron microscope
- scanning transmission electron microscopy
- scatter diagram
- scattering area
- scattering-absorption contrast
- Schottky emission
- Schottky-emission electron gun
- scintillator
- SDD
- SE
- SE detector
- SE electron gun
- SE image
- SE1
- SE2
- SE3
- secondary electron
- secondary electron emission coefficient
- secondary yield
- secondary-electron detector
- secondary-electron image
- SED
- see-through SEM
- selected-area electron channeling pattern
- selective etching
- selective potentiostatic etching by electrolytic dissolution method
- SEM
- SEM-Raman combined system
- semi-in-lens objective lens
- SEMラマン装置
- service port
- SE電子銃
- shadow-less deposition due to gas scattering
- Si(Li) detector
- silicon-drift detector
- silver paste
- SIM image
- SIM像
- SIP
- Si検出器
- SLEEM
- slush nitrogen
- snorkel objective lens
- spatial resolution
- specimen chamber
- specimen contamination
- specimen cooling stage
- specimen current
- specimen damage
- specimen drift
- specimen exchanging rod
- specimen grid
- specimen heating stage
- specimen holder
- specimen mount
- specimen stage
- specimen stub
- specimen supporting film
- specimen tensile stage
- specimen-exchange chamber
- spectrum imaging
- spectrum mapping
- spectrum resolution
- SPEED法
- spherical aberration
- spin SEM
- spin-polarized SEM
- spot size
- SPPED method
- sputter coater
- sputter ion pump
- sputtering
- SREM
- stability of electron-beam current
- staining
- Standard Microscale
- standard specimen
- standard-less correction
- state analysis
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